Image SXM 191
mage SXM is a version of the public domain image analysis software NIH Image that has been extended to handle the loading, display and analysis of scanning microscope images. Image SXM supports SAM, SCM, SEM, SFM, SLM, SNOM, SPM and STM images from the following systems: Asylum Research, Burleigh Instruments, Digital Instruments NanoScope II, Digital Instruments NanoScope III/IV, DME Rasterscope, DME Surface Data File, Gatan DigitalMicrograph, JEOL JSM, JEOL WinSem, JEOL WinSPM, JPK Instruments, Klocke Nanotechnik Atomikro, Leica TCS, LEO SEM, Molecular Imaging PicoScan, NanoMagnetics Instruments SPMSIF, Nanonics Imaging, Nanonis, Nanotec Electronica WSxM, Noran Instruments Vantage, NT-MDT, Omicron Vakuumphysik, Omicron SCALA, Oxford Instruments TOPSystem, Park Scientific Instruments HFS-LIF, Park Scientific Instruments HDF, Philips SEM, Quesant Instruments, RHK Technology SPM-32, RHK Technology XPM Pro, Seiko Instruments (SIINT) SPI, SPECS STM Aarhus, ThermoMicroscopes, TopoMetrix SPMLab, Unisoku, Vacuum Generators SAM, WA Technology, Zeiss LSM.
Changes: 0
• A new 'Distort To Fit' item.
• Bug fix for loading TIFF images from JEOL, JPK, LEO and Zeiss.
• Bug fix affecting scrolling in save dialogs.
• Compensation suffix now inserted before any filename suffix.
• When duplicating the 'copy' suffix is now inserted before any filename suffix.
• Macro commands 'UpdatesOff' and 'UpdatesOn' have been added.
